NEPTUNE TEST SYSTEM

NEPTUNE is a semiconductor automatic test system with a true-parallel “tester-per-channel” flexible architecture.  Its compact dimensions, software and hardware flexibility and compatibility with most known test-handlers/wafer-probers bring exceptionally low cost of ownership and high efficiency of use.

Process application area:

  • High and middle volume production test
  • Research and development activities
  • Wafer level and package level test with direct docking or cable connection to a handler/prober

Device under test application area:

  • Digital ICs  (microprocessors, microcontrollers, standard logic ICs, FPGAs, PLDs, etc.);
  • Memory ICs  (RAM, ROM, FLASH, etc.);
  • Radio frequency identification (RFID)
  • Analog ICs (various amplifiers, voltage regulators, etc.)
  • Mixed-signal ICs (ADC/DAC – with the help of external measurements units)